Non-contact thickness measurement of films without radiation

After many years of research and development, the MeSys GmbH from Utting presented a completely new, patented method for measurement of thickness and mass per unit area at thin flat sheets. The measuring sensor USM 200 is again a significant improvement of the existing sensors. It is now offered as a laboratory for hands-free device or traversing thickness measurements in production. The measured material plays a minor role in the measurement. The measurement method is particularly suitable for textiles, nonwovens, paper, plastic, aluminium and various coatings. The measuring range is from 0 to 800 g/m² or 0 to 800 microns. The accuracy of the measurement method is 0.5% of the measured value. Even for harsh industrial environments, the sensor is suitable. The USM 200 is revolutionizing the market with the measuring devices for measuring thickness of thin films and other materials.

USM 200 closes the gap in the existing sensors and TOM and DAC

The sensor unit USM 200 can be the basis of a up to 12 meters wide, non-contact scanning with a scanner. A measuring frequency of 120 Hz makes also high web speeds possible. The measuring area is 5 mm in diameter and a special evaluation discovers even the smallest defects in production. Within 20 mm of height variations have no influence on the result of the measurement with a free measuring gap of at least 40 mm. With this measuring system, the gap in the sensors TOM and DAC is closed. They can also measure non-contact and not radio-metrically the thickness in a range between 200 microns and 200 mm.

The measuring principle of non-contact thickness measurement with the USM 200

Here, the measured object is placed locally in vibration. Depending on the size or weight of the thickness, the transmittance and reflectance changes of the vibration generated on the material is measured. The received oscillations are measured by appropriate sensors and analysed by a fast micro-controller. The size of the oscillation amplitude represents an inverse measure of the weight per unit area at the measuring point. Environmental effects and spurious signals are hidden by a sophisticated control logic. In addition, the accuracy with decreasing density remains the same. As a result, the absolute measurement accuracy increases with decreasing thickness.


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